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Facilities


  • Netzsch STA 449 simultaneous thermal analyzer (thermogravimetric analyzer and differential scanning calorimeter), coupled with Bruker Tensor 27 FT-IR and Netzch QMS-403C mass-selective detection.

  • Solartron 1260 potentiostat and frequency analyzers, Solartron 1250 frequency analyzer for impedance spectroscopy, and Solartron 1296 dielectric interface.

  • Micromeritics ASAP 2010 Accelerated Surface Area and Porosimetry System and Chemisorption Analyzer to determine the physisorptive and chemisorptive nature of nanoscale mesoporous solids.

  • Micromeritics 2010A Chemisorption Controller and Temperature - Programmed Desorption Analyzer to determine the chemisorptive nature of nanoscale mesoporous solids.

  • Shimadzu gas chromatograph with FID and TCD detection.

  • Phillips OmniStar Benchtop residual gas analyzer.

  • 1000-W Hg arc lamp (with appropriate neutral density, cut-off, and infrared filters).

  • Micromeritics AccuPyc 1330 He pycnometer to determine the skeletal density of porous solids.

  • Agilent 8453 UV–Visible photodiode array.

  • Fisons Critical-Point Dryers (three) for liquid and supercritical CO2 processing of gels; ancillary circulators and chillers.

  • CEM Mars 5 microwave synthetic reactor.

  • Varian 3400 GC-Finnegan ion-trap mass spectrometer for molecular identification.

  • SpectraTech Infrared microscope.

  • LeCroy 9400 digital oscilloscopes.

  • Potentiostats; multichannel, high-current (5 A) cyclers; wave-function generators; rotating ring-disc electrode apparatus with hydrodynamic modulation capability, electrode polishing equipment; power supplies (>100 V @ 1.5 A); parallel-plateflow and toroidal dispersion reactors; ball-milling equipment

  • Barnstead NanoPure water purifier.

  • Vacuum Atmospheres Ar-filled glove box.

  • Lindberg tube furnaces; muffle furnaces; vacuum ovens.

  • Analytical facilities (within the branch, the division, and the laboratory) available to this effort with operator status include- Scanning Electron (SEM), Transmission Electron (TEM), and Atomic Force probe (AFM) Microscopy; X-ray Diffractometer; X-ray Photoelectron (XPS), microprobe Raman, and Inductively Coupled Plasma Atomic Absorption (ICP) spectrometers; profilometers; lithography equipment; thermal analyzers; and IR diffuse-reflection, fluorescence, and FTIR spectrometers.

  • External collaborations involve structural characterizations using Small-Angle Neutron Scattering, Transmission Electron Microscopy, X-ray diffraction, magnetic susceptibility, Mössbauer spectroscopy, neutron diffraction, and X-ray Absorption Spectroscopy (for XANES, and EXAFS).

 
   
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