 |
|
|
Facilities
Instrumentation for conducting research of molecular thin films and biointerfaces.
Instruments for chemical/surface analysis
-
X-ray Photoelectron Spectroscopy (XPS)
-
micro-Raman spectroscopy (Renishaw System 1000 Ramanscope with 514, 633 and 785 nm lasers)
-
FTIR spectrometers (Thermo-Nicolet Magna 760s with MCT-B, InSb, MCT-A, and DTGS detectors along with accessories for transmission, grazing angle reflectance, diffuse reflectance, and attenuated total reflectance accessories to analyze polymers, thin films, or liquids.
-
FTIR microscope (Thermo-Nicolet NicPlan, MCT-A detector with ~100 µm spatial resolution)
-
Flash Chromatography (CombiFlash Companion)
-
Semi-Preparative HPLC (Varian)
-
Lyophilizer (Labconoco)
Scanned Probe Microscopy and Nanomechanics Instrumentation
-
Atomic and Lateral Force Microscopes (Digital Instruments Nanoscope IIIa and Multimode AFM),
-
Veeco Nanoman SPM with closed-loop XYZ scanner and nanolithography capabilities
-
Hysitron scanning-nanoindenters (Triboscope and Ubi Bioindenter) with commercial and custom software.
Mechanical property testing
-
Depth-sensing nanoindentation systems: a Hysitron Triboscope and Hysitron Ubi Bioindenter.
-
Depth sensing microindentation testers: UMIS-2000, with nm depth, μN force resolution; Fischerscope H100, with μm-depth, mN-force resolution; a Romulus III hardness tester with 100 N load test capabilities.
-
Engineering hardness tester (Tukon tester).
Non-contact optical profilometers
-
ADE Phase Shift MicroXAM (interferometer)
-
STIL/Nanovea from Microphotonics (chromatic aberration profilometer)
Camera for high speed videography and microscopy – Phantom v7.3 (> 100k fps)
Optical spectrometer (UV/VIS/NIR) with high-speed data acquisition (1 ms/spectrum)
Instrumentation for conducting research in friction, wear, and boundary lubrication
-
Computerized reciprocating sliding and pin-on-disk tribometers in controlled environments,
-
In situ Raman microscopy reciprocating tribometer with real-time, in-contact video and micro-Raman analysis
-
CSEM pin-on-disk tribometer
-
Hysitron 2D force transducers for friction sensing at uN to mN applied loads
-
Polishing wear tester with nanometer-scale resolution
-
CSEM calowear ball cratering wear tester;
-
ASTM standard four-ball wear tester and an ASTM standard pin and Vblock lubrication tester
Instrumentation for investigating adhesion of coatings
-
Romulus III with modules for scratch, pull, shear and blade adhesion testing;
-
Hysitron Ubi and Triboscope 2D transducer scratch capability
-
UMIS-2000 nanoscratch tester
-
Instrumented low load/displacement pull and shear tester with video monitoring of the contact.
|
|
|