Found 10 results
Filters: Author is Katzer, D S  [Clear All Filters]
2012
Meyer D, Downey B, Bass R, Katzer DS, Binari SC.  2012.  40 nm T-gate Process Development using ZEP Reflow. 2012 International Conference on Compound Semiconductor Manufacturing Technology.
Meyer DJ, Deen D, Storm D, Ancona MG, Katzer DS, Bass R, Binari SC, Gougousi T, Paskova T, Evans K.  2012.  High quality HfO2/p-GaSb(001) metal-oxide-semiconductor capacitors with 0.8 nm EOT. 48th Workshop on Compound Semiconductor Materials and Devices.
Meyer DJ, Deen D, Storm D, Ancona MG, Katzer DS, Bass R, Binari SC, Gougousi T, Paskova T, Evans K.  2012.  High-k Gate Dielectics for III-N MIS-HEMTs. 48th Workshop on Compound Semiconductor Materials and Devices.
Meyer DJ, Deen D, Storm D, Ancona MG, Katzer DS, Bass R, Binari S, Gougousi T, Paskova T, Evans K.  2012.  High-k SrTiO3 Dielectric by Plasma-Assisted Atomic Layer Deposition. 48th Workshop on Compound Semiconductor Materials and Devices.
Meyer DJ, Deen D, Storm D, Ancona MG, Katzer DS, Bass R, Binari SC, Gougousi T, Paskova T, Evans K.  2012.  High-Power Broadband Cascaded-TWT Development. 48th Workshop on Compound Semiconductor Materials and Devices.
Downey B, Meyer DJ, Bass R, Katzer DS, Binari SC.  2012.  Thermoelectroelastic Simulation of GaN Devices. Journal of Vacuum Science & Technology B. 30
Downey B, Meyer DJ, Bass R, Katzer DS, Binari SC.  2012.  Thermoelectromechanical Simulation of GaN HEMTs. Journal of Vacuum Science & Technology B. 30
Downey B, Meyer DJ, Bass R, Katzer DS, Binari SC.  2012.  Thin A12O3-TiO2 Nanolaminates: An investigation of Atomic Layer Deposited Hybrid Oxides for Gate Dieletrric Applications. Journal of Vacuum Science & Technology B. 30
Katzer DS, Meyer DJ, Storm D, Mittereder JA, Bermudez VM, Cheng SF, Jernigan GG, Binari S.  2012.  Ultra-high vacuum deposition and characterization of silicon nitride thin films. Journal of Vacuum Science & Technology B. 30(2)