Dr. John Seely Elected APS Fellow

2/19/2007 - 8-07r
Contact: Public Affairs Office, (202) 767-2541

Dr. John Seely of the Naval Research Laboratory's Space Science Division has been elected a Fellow of the American Physical Society (APS) in the Division of Plasma Physics. APS recognized Dr. Seely with election to fellowship "for fundamental contributions to the x-ray spectroscopy of hot laser-produced and solar plasmas, and for the determination of the atomic energy levels of highly-charged ions."

The APS Fellowship Program recognizes members who have made advances in knowledge through original research and publication or made significant and innovative contributions in the application of physics to science and technology. Election to APS Fellowship is limited to no more than one half of one percent of the membership.

Over the past 20 years, Dr. Seely has been a leading researcher in the areas of atomic physics and x-ray spectroscopy of laser-produced and solar plasmas. He has made fundamental contributions regarding the precise measurement of the wavelengths of transitions in highly-charged ions and determined the atomic energy levels. By carefully comparing the measured energy levels with those he calculated using atomic physics computer codes, Dr. Seely determined the high-Z relativistic and QED corrections to the energy levels.

Dr. Seely received his B.S. in physics from North Carolina State University and a Ph.D. in physics from the University of Tennessee. He was a post-doc at the University of Southern California before joining NRL as a post-doc in 1977 and becoming a permanent hire in 1979. He presently heads the Spectroscopy Section in the Space Science Division's Solar Terrestrial Relationships Branch, and manages science experiments and operations at NRL's Beamline X24C at Brookhaven's National Synchrotron Light Source. This facility is used for the development and calibration of spaceflight and laboratory X-ray optics, detectors, and instruments.

Dr. Seely is the author or coauthor of 210 publications in refereed scientific journals. He has contributed to seven patents on X-ray and Extreme Ultraviolet (EUV) imaging devices, including intense short-pulse x-ray sources and EUV optics. He has received several NRL Technology Transfer Awards and an NRL Publication Award. Dr. Seely is also a Fellow of the Optical Society of America.

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