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181114-N-N0204-005.JPG Photo By: Daniel Parry

WASHINGTON, D.C. - (a) Experimental schematic of conductive atomic force microscopy (CAFM). (b) Sample CAFM image showing eight clearly identifiable defects. (c) Photoluminescence (PL) intensity map of a WS2 triangle. (d) PL intensity and defect density along the dashed black line in (c) showing an inverse relationship between PL intensity and defect density. (U.S. Naval Research Laboratory)


This photograph is considered public domain and has been cleared for release. If you would like to republish please give the photographer appropriate credit.

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