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160420-N-N0204-001.JPG Photo By: Daniel Parry

WASHINGTON, D.C. - Image shows high magnification bright field transmission electron microscopy (TEM) image showing obvious delineation of alumina film and surface of particle. In this work, performed by NRL researchers, the growth per cycle (GPC) during atomic layer deposition is compared for different batches of powder with average particle sizes ranging from nanometer (nm) to micrometer (μm). Samples prepared after depositing thin alumina films (from 10 to15 nm) on tungsten powders using particle atomic layer deposition (p-ALD) were investigated with x-ray photoelectron spectroscopy (XPS), scanning and transmission electron microscopy (SEM), and TEM. (U.S. Naval Research Laboratory) RELEASED


This photograph is considered public domain and has been cleared for release. If you would like to republish please give the photographer appropriate credit.

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